Electronic Publication/s
Selective interface toughness measurements of layered thin films
×
Selective interface toughness measurements of layered thin films
Details
Subject Area
Natural Science
Quality review
refereed - online
R. Konetschnik, R. Daniel, R. Brunner, D. Kiener
Selective interface toughness measurements of layered thin films
page 1
doi:
10.1063/1.4978337
Abstract
PDF
